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RELIABILITY TESTSTECHNICAL NOTES50www.SunLEDusa.comThrough-Hole LEDsTest ItemTest ConditionsDescriptionReference StandardContinuous operatingTa=25°C T=1000hrsThe purpose of this test is to determine the resistance of the device when operating under electrical stressEIAJ ED-4701 100 101RH<75%RH, IF(Max)High temperature storage Ta=100°C T=1000hrs The purpose of this test is to evaluate the product durability after long-term storage in high temperatureEIAJ ED-4701 200 201Low temperature storage Ta=-40°C T=1000hrsThe purpose of this test is to evaluate the product durability after long-term storage in low temperatureEIAJ ED-4701 200 202 High temperature andhumidity storageTa=60°C T=1000hrsThe purpose of this test is to evaluate product durability under long-term high temperature and high humidity storageEIAJ ED-4701 100 103RH=90%RHHigh temperature andhumidity operatingTa=60°C T=1000hrsThe purpose of this test is to determine the resistance of the device under electrical and thermal stressEIAJ ED-4701 100 102RH=90%RH, IF(Max)Lead frame bending Bend 90°C T=3 cyclesThe purpose of this test is to evaluate products durability against mechanical stress applied to leadsN/ALead frame pulling W=1kg T=30secThe purpose of this test is to evaluate products durability against mechanical stressN/ASolderability Ta=245°C T=5sec The purpose of this test is to evaluate solderability on leads of deviceEIAJ ED-4701 300 303Soldering resistanceTa=260°C T=5sec The purpose of this test is to determine the thermal resistance characteristics of the device to sudden exposures at extreme changes in temperature during Tin-dippingEIAJ ED-4701 300 302Temperature cycling Ta=-40°C~25°C~100°C~25°CThe purpose of this test is to determine the resistance of the device to storage under extreme temperature for hoursEIAJ ED-4701 100 105T=(30min~5min~30min~5min)×10cyclesTemperature cyclingoperatingTa=-40°C~25°C~100°C~25°C IF(Max)The purpose of this test is to determine the resistance of the device under extreme temperature for hoursN/AT=(30min~5min~30min~5min)×10cyclesThermal shock Ta=-40°C~100°CThe purpose of this test is to determine the resistance of the device to sudden extreme changes in high and low temperatureEIAJ ED-4701 300 307T=15min~15min×100cyclesRELIABILITY TESTS