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RELIABILITY TESTS TECHNICAL NOTES50www.SunLEDusa.comThrough-Hole LEDsTest Item Test Conditions Description Reference StandardContinuous operatingTa=25%u00b0C T=1000hrs The purpose of this test is to determine the resistance of thedevice when operating under electrical stress EIAJ ED-4701 100 101RH<75%RH, IF(Max)High temperature storage Ta=100%u00b0C T=1000hrs The purpose of this test is to evaluate the product durabilityafter long-term storage in high temperature EIAJ ED-4701 200 201Low temperature storage Ta=-40%u00b0C T=1000hrs The purpose of this test is to evaluate the product durabilityafter long-term storage in low temperature EIAJ ED-4701 200 202 High temperature andhumidity storageTa=60%u00b0C T=1000hrs The purpose of this test is to evaluate product durabilityunder long-term high temperature and high humidity storage EIAJ ED-4701 100 103RH=90%RHHigh temperature andhumidity operatingTa=60%u00b0C T=1000hrs The purpose of this test is to determine the resistance of thedevice under electrical and thermal stress EIAJ ED-4701 100 102RH=90%RH, IF(Max)Lead frame bending Bend 90%u00b0C T=3 cycles The purpose of this test is to evaluate products durabilityagainst mechanical stress applied to leads N/ALead frame pulling W=1kg T=30sec The purpose of this test is to evaluate products durabilityagainst mechanical stress N/ASolderability Ta=245%u00b0C T=5sec The purpose of this test is to evaluate solderability on leadsof device EIAJ ED-4701 300 303Soldering resistance Ta=260%u00b0C T=5sec The purpose of this test is to determine the thermal resistancecharacteristics of the device to sudden exposures at extremechanges in temperature during Tin-dippingEIAJ ED-4701 300 302Temperature cycling Ta=-40%u00b0C~25%u00b0C~100%u00b0C~25%u00b0C The purpose of this test is to determine the resistance of thedevice to storage under extreme temperature for hours EIAJ ED-4701 100 105T=(30min~5min~30min~5min)%u00d710cyclesTemperature cyclingoperatingTa=-40%u00b0C~25%u00b0C~100%u00b0C~25%u00b0C IF(Max) The purpose of this test is to determine the resistance of thedevice under extreme temperature for hours N/AT=(30min~5min~30min~5min)%u00d710cyclesThermal shock Ta=-40%u00b0C~100%u00b0C The purpose of this test is to determine the resistance ofthe device to sudden extreme changes in high and lowtemperatureEIAJ ED-4701 300 307T=15min~15min%u00d7100cyclesRELIABILITY TESTS